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2160 lines/mm Shadow cast carbon replicas of diffraction line gratings, single direction lines -
BSE Reference - Aluminium/Silicon -
BSE Reference - Nickel/Copper
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BSE Reference - Palladium/Silver
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BSE Reference - Platinum/Gold
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Negatively stained catalase crystals show lattice plane spacings of approximately 8.75nm and 6.85nm very clearly (using TEM and STEM). (Figures determined by Wrigley. J. Ultrastructure Res. 24, 454. 1968). They are valuable for high magnification calibration. -
CD Calibration Specimen 0.5-10um GPTB Certified -
CD Calibration Specimen 0.5-10um Non Certified
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Critical dimension (CD) calibration test specimens - 500-200-100 nm structure -
CD Calibration Specimen 500-200-100nm with GPTB Cert.
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A silicon test specimen made of single crystal silicon of overall dimensions 5 x 5mm and is 0.5mm thick. -
Chessy test specimen -
Combined test specimen -
2160 lines/mm Shadow cast carbon replicas of diffraction line gratings, Cross Direction -
Diffraction grating replica with latex spheres -
Duplex reference specimen
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